Now showing items 1-2 of 2

    • Yakovlev, Vladislav Victorovich; Fry, Edward S.; Mason, John David; Bixler, Joel Nathan; Cone, Michael Thomas; Hokr, Brett Harrison (United States. Patent and Trademark Office; Texas A&M University. Libraries, 2018-03-27)
      Disclosed is a high reflectivity integrating cavity and device to amplify and detect luminescent emissions produced by small concentrations of materials to be analyzed. Femto or nano molar concentrations of a material can ...
    • Cone, Michael Thomas (2014-04-16)
      We report the development of a new diffuse reflecting material with measured diffuse reflectivity values as high as 0.9992 at 532 nm, and 0.9969 at 266 nm. These values are, to the author’s best knowledge, the highest ...